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모델 Micro Prof		The FRT MicroProf^® functions as a non-contact, optical profilometer (2D) as well as an imaging device (3D) by means of a scanning method. Roughness and waviness can be determined in 2D as well as in 3D. The remarkable features of these devices are the easy operation and the rapid availability. Figure right: The FRT MicroProf^® (Standard Version)

	MicroProf^® ^{모델별사양}	MicroProf^{® Product} ^4가^{지 Version 설명서}
제품명	Micro Prof
제품정보	The FRT MicroProf^® devices are measuring systems for the rapid optical topography measurement as well as for the measurement of layer thickness on sur-faces. These devices were especially developed for daily application: short measuring times, large meas-uring ranges and robust construction constitute the main features of all devices. Thanks to their easy operating (Windows software) these systems constitute ideal measuring instruments for the process control in works. Besides, the powerful evaluation software FRT Mark III allows a detailed analysis of the measuring data for the development and measuring departments.
	Roughness and contour measurements in every direction, in 2D as well as in 3D, characterize the MicroProf^® as flexible and powerful measuring instrument. The device allows high-resolution measurement of 3D-sections with section size and measuring point density freely selected. The affiliated software delivers 2D- and 3D evaluated data, complying with the DIN and ISO standards for the evaluation of lines and roughness.

	Topographie of a SiC-ceramics		Profil measurement of a glass standard
	The various devices differ in the measuring method, the measuring range and the accuracy. The MicroProf^® (Standard) is delivered in combination with the optical sensor CHR 150 for the accurate topography measurement. The MicroProf® Autofocus also functions in combination with an optical topography sensor and partly allows faster measurement with an only slightly reduced accuracy. The MicroProf^® Junior rounds the line of the instruments off and also serves to measure topography of coarser structures. The MicroProf^® Film thickness however does not give any topography information, but acquires non-contact and very fast the film thickness of transparent thin film
[이전][다음] 휴대용 Roughness Meter 스위스 DIAVITE사 Autofocus Laser 타입 3차원 비접촉식 표면형상측정기
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