Marklll

[?][Marklll]

The extensive program functions allow the evaluation of lateral and vertical distances, angles, histograms and bearing curves. To determine surface roughness and waviness, many surface parameters will be evaluated according to DIN/ISO standards and the Motif-method.

figure : Topography data as well as roughness and waviness data of a sheet metal

力前疙

Mark III

力前沥焊

Area and volume measurements, fractal dimension, particles counting and autocorrelation are also part of the functions integrated in the program.

In addition to the top view, the program also offers a versatile 3D-view option allowing under any angle whatever the representation of data in perspective. By switching on a virtual light

source, the surface will be "illuminated" and detailed structures of the surface will be intensified.

Any profile can be moved through the 3D-data and fitted via polynoms and aspherical functions. With this, the form and contour of components (e.g. radius of curvature) can be determined easily. The comparative function enables a detailed analysis of desired and actual data.

All diagrams and analysis results may be exported to common graphics formats or to the ASCII-format. In order to allow an appropriate presentation, all diagrams may be annotated.

Thanks to user-defined measuring protocols, various possibilities of printing are offered to the user.

In short: FRT Mark III offers an extensive and complete analysis of image and profile data from different origins.

Mark III offers

Support for various file formats of different scanning probe microscopes and profilometers (further formats and user-defined formats upon request)

Support for common graphics formats

Extensive filter and modification routines

Representation as top view and as 3D-view under any angle and with virtual illumination as well

Analysis of distances, areas, volumes, angles, etc...

Determination of roughness/waviness according to DIN/ISO standards and Motif-method

Evaluation of histograms, bearing curves, grain sizes, fractal dimension and autocorrelation

Profile function, dynamic profile

Fit routines (e.g. for the determination of radius of curvature and aspheres)

Comparative function, zoom function

Calibration in x, y and z (e.g. of REM and LM plots)

Automatic recording of the analysis process and results

Annotation and printing of the representations and diagrams, printing of user-defined protocols

Data export as BMP-, JPG-, GIF- and TIF-file

Software for Windows⑩ available in German and English

After-sales support by phone, fax or email

[?][Marklll]
The extensive program functions allow the evaluation of lateral and vertical distances, angles, histograms and bearing curves. To determine surface roughness and waviness, many surface parameters will be evaluated according to DIN/ISO standards and the Motif-method. figure : Topography data as well as roughness and waviness data of a sheet metal

力前疙	Mark III
力前沥焊	Area and volume measurements, fractal dimension, particles counting and autocorrelation are also part of the functions integrated in the program. In addition to the top view, the program also offers a versatile 3D-view option allowing under any angle whatever the representation of data in perspective. By switching on a virtual light source, the surface will be "illuminated" and detailed structures of the surface will be intensified. Any profile can be moved through the 3D-data and fitted via polynoms and aspherical functions. With this, the form and contour of components (e.g. radius of curvature) can be determined easily. The comparative function enables a detailed analysis of desired and actual data. All diagrams and analysis results may be exported to common graphics formats or to the ASCII-format. In order to allow an appropriate presentation, all diagrams may be annotated. Thanks to user-defined measuring protocols, various possibilities of printing are offered to the user. In short: FRT Mark III offers an extensive and complete analysis of image and profile data from different origins. Mark III offers Support for various file formats of different scanning probe microscopes and profilometers (further formats and user-defined formats upon request) Support for common graphics formats Extensive filter and modification routines Representation as top view and as 3D-view under any angle and with virtual illumination as well Analysis of distances, areas, volumes, angles, etc... Determination of roughness/waviness according to DIN/ISO standards and Motif-method Evaluation of histograms, bearing curves, grain sizes, fractal dimension and autocorrelation Profile function, dynamic profile Fit routines (e.g. for the determination of radius of curvature and aspheres) Comparative function, zoom function Calibration in x, y and z (e.g. of REM and LM plots) Automatic recording of the analysis process and results Annotation and printing of the representations and diagrams, printing of user-defined protocols Data export as BMP-, JPG-, GIF- and TIF-file Software for Windows⑩ available in German and English After-sales support by phone, fax or email